STS8300EX テストシステム
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STS8300EX テストシステム
●Test Head Architecture-” All In One”
▹300-500+ Analog Ch.
▹256 digital Ch.@83.3MHz
●Focus on high pin count, high parallel PMIC test
●Hard docking (over head docking) solution -
●Ope-Amp Test Solution
●VCM Test Solution
●DrMOS Test Application
●DrGaN Test Application
●Digital IPD Test Solution-
・X8 -16 Multi-site for Probe Test
・Up to 8 test stages in multi-task mode with Turret handler for Package Test
●Digital IPM Test Solution
●SiC Gate Driver Test Solution
●Multi-Cell Li-Ion Battery Manager Test Solution
・12-18 Multi-Cells